MicronFrom company site
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You will own the development, qualification and deployment of advanced metrology applications for 3D NAND process development, focusing on Focused Ion Beam (FIB) and at least one of AFM, SEM or WLI. You will develop innovative metrology solutions to close inline detection gaps and speed up process learning. You will lead evaluation and deployment of next-generation metrology systems and First-of-a-Kind technologies, assessing measurement capability, accuracy, repeatability, throughput, automation and manufacturing readiness. You will establish technology roadmaps and build strong technical partnerships with equipment suppliers and industry collaborators. You will also explore modelling opportunities using metrology, defect detection, AI and machine learning to understand electrical failure signatures and their impact on product reliability, yield and performance. You will work closely with Process Integration, Yield Enhancement, Process Development Engineering and Manufacturing teams.
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