Full-timeTech & engineering· Posted 4 Oct

Senior/Principal Eng, FE OCT CPEE PHOTO METROLOGY

MicronApply on company site

Salary

Not stated by the company

When

Full-time hours

Where

SingaporeFab 10A, Singapore

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Start: Not stated
Work mode: On-site
Experience: Experienced

About the role

This role leads high-volume manufacturing photo metrology, with a focus on overlay metrology, covering yield, quality, productivity and cost improvements. You will act as the technical authority for complex photo metrology issues across fabs and drive supplier roadmap and engagement, working closely with internal partners and suppliers. It suits an experienced semiconductor photolithography engineer who is comfortable leading problem solving across functions and working with global teams.

What you'll do

Lead yield, quality, productivity and cost improvement initiatives for HVM photo and overlay metrology
Resolve complex photo and overlay metrology issues using data-driven root-cause analysis

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Define and deploy photo and overlay metrology Best Known Methods across fabs for HVM and NPI

Serve as the technical point of contact for cross-fab, complex photo and overlay metrology customer concerns

Drive MOR–POR gap closure and cross-fab and cross-node alignment with internal teams and suppliers

Influence key suppliers and represent OCT in reviews, workshops and governance forums

Integrate AI-assisted tools and insights into daily work to improve efficiency, quality or effectiveness

Contribute to continuous improvement by identifying, testing and sharing AI-enabled enhancements

Apply digital fluency and role-appropriate AI literacy to use AI-enabled tools responsibly for research, analysis, content creation, problem-solving and operational tasks

Good to know

Based at Fab 10A, Singapore
Flexibility for business travel and overseas assignment

Requirements

BS/MS/PhD in Electrical Engineering, Physics, Materials Science, Chemical Engineering or a related field
5+ years (Senior) or 8+ years (Principal) experience in semiconductor photolithography in NPI/HVM manufacturing
Strong hands-on experience in photo/overlay metrology engineering covering yield, quality, productivity and cost improvement
Proven experience solving challenges involving overlay, CDU, metrology, reticle correction, MMM, destack and yield matching
Experience defining and deploying Best Known Methods across tools, nodes or fabs
Able to act as technical point of contact for blocking issues and lead multi-function problem solving

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Senior/Principal Eng, FE OCT CPEE PHOTO METROLOGY

About the role

What you'll do

Good to know

Requirements

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